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It offers a wide excitation range of 240–850 nm and emission range of 200–900 nm with wavelength resolution of 0.1–10 nm. The system uses an ultra-fast CCD detector for rapid spectral acquisition and includes built-in second-order filters for improved spectral purity. 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Developed base on Texas Instrument DLP™ Digital Micramirror Device. The most cost-effective near-infrared spectrometer. Excellent signal-to-noise ratio performance which improves measurement stability. Fully technical support in firmware/software for customized system development. 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Wavelength range: 200 nm-900 nm Range or wider\n2. Wavelength resolution: 1.34 nm/25μm slit\n3. Detector: linear silicon CCD array\n4. Integration time at 1ms – 60s\n5. Signal-to-noise ratio (single scan):250:1\n6. Dynamic range: 1300:1 for a single acquisition\n7. Computer Interface: USB 2.0\n8. A/D resolution:16 bit\n9. User interchangeable slit without need for recalibration\n10. Thermally stable optical bench\n11. Light source: Osram XBO 100wattXenon lamp\n12. Monochromatic light source directly coupled to CCD array detector\n13. Sample compartment: Cuvette Holder for Liquids and45 holder for Solids, thin films\nand powders\n14. Exciting optical filters: Excitation through monochromator Continuous variation of\nWavelength from 240- 850nm\n15. Emission monochromator: Czerny turner diffraction grating with CCD solid state\narray detector capable of simultaneous acquisition of all emission wavelengths\n16. Excitation wavelength :240-850nm\n17. Emission wavelength: 200- 900nm\n18. 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